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  • Diagnostic
    • Anterior segment
    • Binocular aberrometry
    • Diagnostic units
    • Fundus camera
    • Slit lamps
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  • Refraction
    • ARK
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    • Lens detection and analysis
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    • Slit lamps
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Home Multimodal platform, combining ARK with a Placido topographer- VX110- Visionix

Multimodal platform, combining ARK with a Placido topographer- VX110- Visionix

The VX110 is a multimodal platform, combining Auto-Refraction/Keratometery with a Placido topographer. The VX110 offers multiple functionality with space saving practicality. The VX110 offers high resolution and high accuracy offering more than basic refraction. This provides eye care professionals the opportunity to embrace the cornea and refractive process and deliver an easier and more complete testing procedure for clinician and patient.

    Please leave us your contact details and we will come back to you promptly to schedule a remote demonstration. You will need a computer with an internet access, ideally equipped with a webcam and a mic (or a separate phone to liaise the audio).

    Category: Non classé Tags: ARK, Diagnostic, Refraction, Screening, Visionix
    • Key benefits
    •  Documentation
    •  Cleaning guidelines

    Description

    Maximise your customer experience with a complete refraction
    • Objective day and night refraction measurements
    • 1300 points points analyzed for a 7-mm diameter pupil
    • Objective refraction under mesopic and photopic conditions
    • Measures lower-order and higher-order aberrations
    • Access visual acuity and quality of vision on a pupil as small as 1.2 mm
    • MTF*curve (* Modulation Transfer function)
    Empower your screening and monitoring capacities
    Keratoconus identification and monitoring
    • Axial, tangential elevation and refraction maps
    • Keratoconus probability index (KPI)
    • Keratoconus monitoring
    • Internal astigmatism measurement
    • Eccentricity and meridian tables
    • Corneal aberrometry
    Cataract identification and monitoring
    • Visualization of crystalline opacities
    • Analysis of wavefront aberrations, with the ability to separate corneal and lenticular/internal aberrations
    • Internal astigmatism measurement
    • Kappa angle for IOL centering
    • Z.4.0 value for aspheric implant
    • Lens opacity classification (LOCS II and III scales)
    Rigid contact and ortho K contact lens fitting
    • Keratometry readings
    • Show the corneal astigmatism
    • The AVG K (value used by contact lens manufacturer)
    • Axial, tangential elevation and refraction maps
    • Aberrometry analysis to see the level of the spherical aberration, important feature to adapt multifocal contact lens

    Documentation

    Cleaning guidelines

    Product desinfected

    FC001163-instructions-cleaning-sterilization-VX120-1FC001163-instructions-cleaning-sterilization-VX120-2

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    Contact

    Luneau Technology Operations

    2 rue Roger Bonnet

    27340 Pont-de-l'Arche - France

    picto-phone

    +33 2 32 98 91 32



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